Profilometers for Non-Contact Measurement


  3D profile of an accelerometer mold topography of an accelerometer mold 2D line scan
  3D Profile of an
Accelerometer Mold
Click here to enlarge.
Topography of the Same Part 2D Line Scan

  MEMS (MicroElectroMechanicalSystems) and micromechanical parts are placing new demands on surface metrology equipment due to the fragility and small size of the components being fabricated.

MEMS technology is gaining ever-increasing R&D effort to produce high volume, low cost electromechanical structures and systems for a variety of uses. These can range from pressure or airbag sensors and acceleration transducers up to ink jet cartridges or read/write heads.

  3D profile of a spiral test structure topography of a spiral test structure 2D line scan
  3D Profile of a Spiral
Test Structure
Click here to enlarge.
Topography of the Same Part 2D Line Scan
  Measurement tasks inlcude:
 
  • Flatness
  • Thickness
  • Height
  • Profile
  • Roughness
  The ideal systems for MEMS measurement are the NanoSurf and the UBM/Keyence.
  Contact us for detailed product information.

 

 

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