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SolarMap Profile is
a powerful tool for analyzing profiles measured by any kind of
2D instrument. It comprises the cutting edge technology in analysis and
visualisation,
including standardized methods and parameters.
SolarMap Profile
features:
- Display of roughness
and waviness profiles (gaussian, RC2-ISO, RC2-PC)
- Depth distribution
and Abbott-Firestone curve
- Spectrum analysis
and Power Spectrum Density
- Fractal analysis
- Geometrical measurements
(distance, radius, area, volume,...) and step height measurement
- Measurement of
a hole
- Mathematical separation
of the form, waviness and roughness properties of the features; Least
square line levelling
- Roughness parameters:
Ra, Rt, Rp, Rv, Rq, Rsk, Rku, Rz, RSm, Rc, RTp, RHTp, RDq, RLq, RzJIS,
PC, HSC, RLo, R3z, Rtm, Ry, and their equivalent on raw or waviness
profiles.
- German parameters
(DIN 4776 / ISO 13565): Rk, Rpk, Rvk, MR1, MR2, A1, A2, Rpk*, Rvk*
- French parameters
(CNOMO E05.015 / ISO 12085): R, AR, Rx, Pt, Kr, W, AR, Wx, Wte, Kw,
Rke, Rpke, Rvke, Trc, HTrc.
All contents copyright
© 1999-2001 UBM.
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